We are observing the structure of materials in order to understand the physical property of materials in a microscopic point of view. To this end, we perform diffraction measurements in our lab as well as synchrotron facility.
Our vision is to understand the properties of various materials from microscopic point of view. The objects can be spread in diverse area of solid state physics. So far, we have been working on
(1) Strongly correlated materials such as transition metal oxides, f-electron systems
(2) Organic semiconductors, organic conductors and complexes, and
(3) ionic liquids.
From different point of view, our target materials can be written as:
(1) Bulk single crystals,
(2) Epitaxial thin films whose thicknesses are ranging from 1 unit cell thick to 500 nm, and
(3) Interfaces and surfaces.
Recently, we are trying to develop a new analyzing method of surface x-ray diffraction data under a collaboration with informaticians.
How do we do that?
We observe minute changes in structure in materials that accompanied with some changes in properties. This observation is made through the diffraction technique, which allows us to see pm (10-12 m) change of atomic positions. Our observation is not limited in three-dimensionally ordered systems but low-dimensionally ordered systems or short range ordered systems by analyzing the diffuse scattering. Element- or valence- specific measurement is one of the specialty of our technique. We use various technique of diffraction in order to obtain the information we want --- sometimes we develop a certain technique for our purpose.
Mr. Y doing his experiment at the Photon Factory, a synchrotron facility.
Mr. I who is giving his first talk at an academic meeting, and Mr. Y, who is presenting his results at an international conference.